| 运用t检验评估3DES算法的侧信道信息泄露 |
| 陈佳哲, 李贺鑫, 王亚楠, 王宇航 |
| 中国信息安全测评中心, 北京 100085 |
| Evaluating side-channel information leakage in 3DES using the t-test |
| CHEN Jiazhe, LI Hexin, WANG Yanan, WANG Yuhang |
| China Information Technology Security Evaluation Center, Beijing 100085, China |
摘要:
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| 摘要t检验是统计学中用来检验2个未知方差正态总体均值关系的假设检验方法。当总体的方差不相等, 且样本量也不相等时, Welch t检验是一种比Student's t检验更可靠的方法。该文将借鉴采用t检验对AES的实现进行侧信道信息泄露评估的方法, 用Welch t检验来对3DES算法运行过程中的侧信道信息泄露进行评估, 以衡量其是否可能受到一阶DPA攻击。该文构造了适合于3DES算法的Welch t检验方法, 并对实现方法不同的3个运行3DES算法的设备进行了实验。实验结果表明该文的方法是有效的。 | |||
| 关键词 ：Welch t检验,3DES算法,侧信道,信息泄露评估 | |||
| Abstract：The t-test is a hypothesis test that deals with two Gaussian samples with unknown variances. When the two samples have unequal variances and unequal sample sizes, the Welch t-test is more reliable than the Student's t-test. This paper evaluates the 1st order side-channel information leakage of 3DES with an AES type t-test. Welch t-tests suitable for evaluating 3DES are given with tests on three different devices that show this method is effective. | |||
| Key words：Welch t-test3DES algorithmside-channelinformation leakage evaluation | |||
| 收稿日期: 2016-01-24 出版日期: 2016-05-19 | |||
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| 引用本文: |
| 陈佳哲, 李贺鑫, 王亚楠, 王宇航. 运用t检验评估3DES算法的侧信道信息泄露[J]. 清华大学学报（自然科学版）, 2016, 65(5): 499-503. CHEN Jiazhe, LI Hexin, WANG Yanan, WANG Yuhang. Evaluating side-channel information leakage in 3DES using the t-test. Journal of Tsinghua University(Science and Technology), 2016, 65(5): 499-503. |
| 链接本文: |
| http://jst.tsinghuajournals.com/CN/10.16511/j.cnki.qhdxxb.2016.25.007或 http://jst.tsinghuajournals.com/CN/Y2016/V65/I5/499 |
图表:
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| 图１ DES算法的轮运算 |
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| 表１ 设备D１的检验结果 |
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| 图２ 对设备D１第１个５万条曲线的检验１中所有３２个比特在所有时间点的t值 |
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| 表２ 设备D２的检验结果 |
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| 图３ 设备D２第２个５万条曲线的检验４中 所有３２个比特在所有时间点的t值 |
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| 图４ 设备D３的３DES算法的电磁信号曲线 |
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| 表３ 设备D３的检验结果 |
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| 图５ 对设备D３第１个５万条曲线的 检验８中的所有结果的t值 |
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