A new approach to test generation for combinational circuits

Zhao Chun Hui, Hou Yan Li, Hu Jia Wei, Lan Hai Yan

School of Information and Communication Engineering,Harbin Engineering University,Harbin 150001,China



Abstract:

Aimed at the generation of high-quality test set in the shortest possible time, the test generation for combinational circuits (CC) based on the chaotic particle swarm optimization (CPSO) algorithm is presented according to the analysis of existent problems of CC test generation, and an appropriate CPSO algorithm model has been constructed. With the help of fault simulator, the test set of ISCAS’85 benchmark CC is generated using the CPSO, and some techniques are introduced such as half-random generation, and simulation of undetected faults with original test vector and inverse test vector. Experimental results show that this algorithm can generate the same fault coverage and small-size test set in short time compared with other known similar methods, which proves that the proposed method is applicable and effective.

Key words:  test generation  combinational circuits  particle swarm optimization  chaotic optimization

DOI：10.11916/j.issn.1005-9113.2009.01.013

Clc Number:TN407

Fund: