1.Key Laboratory of Magnetism and Magnetic Materials, Ministry of Education, Lanzhou University, Lanzhou 730000, China 2.Key Laboratory of Special Function Materials and Structural Design, Ministry of Education, Lanzhou University, Lanzhou 730000, China
Abstract:In this paper, Ni88Cu12 thin films are prepared on Si substrates by radio-frequency magnetron co-sputtering. The effects of film thickness and heat treatment on domain structure and magnetic properties are studied. The Ni88Cu12 films with thickness less than 210 nm show weak in-plane anisotropy. After the vacuum magnetic field heat treatment, the crystal grains of all films grow, and the in-plane anisotropy extents of Ni88Cu12 films with thickness less than 210 nm become weaker. The films have different morphological characteristics at different heat treatment temperatures. The surface of the film is very dense before heat treatment. After heat treatment at 300 °C, it forms island shape due to the solid solution between the grains. Compared with the grains on the surface of the heat-treated film at 300 °C, the grains grow further after being heat-treated at 400 °C. Grown grains cover the gaps between the grains, which makes the film surface flat. The results of in-plane normalized hysteresis loop of the films show that the critical thickness of the stripe domains decreases after heat treatment. The stripe domain structure appears in the 210-nm-thick films without being heat-treated. For the film with the heat treatment, its remanence ratio Mr/Ms decreases, and the saturation field Hs increases, and thus leading the perpendicular anisotropy constant Kp to increase. Therefore, the thickness of the stripe domain in the film after being heat-treated decreases. Compared with the films after being heat-treated, the 105-nm-thick as-prepared Ni88Cu12 film has a maximum natural resonance frequency of 2.1 GHz, which is attributed to the uniaxial anisotropy of the as-prepared Ni88Cu12 film. The saturation magnetization of the 300 °C-treated 105-nm-thick film decreases to 3.01 × 105 A/m. However, the saturation magnetization decreases to 5.9 × 105 A/m after heat treatment at 400 °C. Moreover, the ferromagnetic resonance peak of the film narrows after being treated at 300 °C, and the resonance frequency decreases to 1.95 GHz. Keywords:stripe domain/ Ni88Cu12/ heat treatment
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3.实验结果与分析图2(a)—(c)分别为未经热处理的Ni88Cu12薄膜在不同厚度下的MFM图像. 实验中, 在膜厚为52, 105和157 nm的薄膜中未观察到明显的条纹畴结构, 图2(a)仅显示了105 nm时的情况. 当膜厚达到210 nm时薄膜中出现了条纹畴结构, 畴宽约为150 nm, 随着膜厚的增加, 条纹畴结构更加明显, 如图2(c)所示, 畴宽增加, 约为180 nm. 图2(d)为不同厚度的Ni88Cu12薄膜的面内归一化磁滞回线, 测试方向为薄膜EA方向. 可以看出, 随着膜厚的增加, 出现条纹畴结构后, 面内磁滞回线的Mr/Ms急剧下降. 在较薄的薄膜中Mr/Ms较大, 也未观察到条纹畴结构, 说明比较薄的薄膜中磁矩更趋向于在面内排列. 而当薄膜较厚时, 会有一部分磁矩偏离膜面, 从而在面外会有一个垂直分量[10]. 可以用Q来表示磁矩偏离膜面的情况: 图 2 未进行热处理的膜厚为(a) 105 nm, (b) 210 nm和(c) 262 nm的Ni88Cu12薄膜的MFM图像; (d)不同厚度Ni88Cu12薄膜的面内归一化磁滞回线; (e)薄膜的Mr/Ms随薄膜厚度的变化 Figure2. The MFM images of (a) 105 nm, (b) 210 nm and (c) 262 nm-thick Ni88Cu12 films before heat treatment; (d) in-plane normalized hysteresis loop of Ni88Cu12; (e) remanence ratio vs. film thickness.