可靠性是研究产品使用寿命的一门新兴学科，作为半导体产品的重要属性，产品可靠性愈来愈受到人们的重视。随着新的材料与工艺的应用，半导体集成电路的线宽进一步减小、集成度进一步提高，对集成电路可靠性的要求也不断提高。可靠性测试，数据处理，以及失效分析是IC可靠性工作的重要组成部分。本课程在介绍可靠性的基本概念、加速寿命试验的方法等基础上，详细讲述产品可靠性，晶圆可靠性，以及可靠性的失效分析技术。

Reliability is academic discipline for products' useable life. As one of the important predicable for semiconductor products, it has been more and more significant to semiconductor industry. With the new applications of advanced material and technology, the shrinkage of design rule and the higher density of integrated circuit lead to the even more stringent requirement on IC reliability.The major components of semiconductor reliability consist reliability test, data management, and failure analysis. The course introduces the concept of reliability, accelerates life test methodology and covers the detailed introduction for the methodology of product reliability, wafer level reliability, and failure analysis.