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Chapter 1: Introduction§1.1 Methods used in Advanced Analytical & Testing TechnologyThe Applications in Physics and Material Science of Advanced Analytical & Testing TechnologyChapter 2: Electron Microscopy§2.1 Development History of Microscpoy§2.2 Principle and Basic Construction of TEM§2.3 Features and Applications of TEM§2.4 Diffraction Contrast and Selected-Area Electron Diffraction§2.5 High Resolution TEM§2.6 Principle and Basic Construction of SEM§2.7 Features and Applications of SEM§2.8 Secondary Electron, Backscattered Electron andCharge Effect§2.9 Latest Applications and Technology of Electron MicroscopyChapter 3: Scanning Probe Microscopy §3.1 Principle and Development History of Scanning Tunneling Microscope§3.2 Basic Construction of STM§3.3 Scanning Tunneling Spectroscopy and Imaging§3.4 Atomic Force Microscopy and its Expanded TechniqueChapter 4: Surface Analysis Techniques for Materials§4.1 Theory and Basic Principle of Surface Analysis Techniques§4.2 Auger Electron Spectroscopy§4.3 X-ray Photoelectron Spectroscopy§4.4 Ultraviolet photoelectron spectroscopy§4.5 Secondary ion mass spectrometry§4.6 Ion scattering spectrometryChapter 5: X-ray Characterization§5.1 The Basic Theory of Crystal Structure§5.2 X-Ray Diffraction Technology§5.3 X-Ray Diffraction Technology for Qualitative, Quantitative analysis and Thin Film§5.4 Small Angle X-ray Scattering Technology and its Application§5.5 X-ray Fluorescence TechnologyChapter 6: Element Analysis Techniques§6.1 Inductively Coupled Plasma-Atomic Emission Spectroscopy§6.2 Atomic absorption spectrometry§6.3 Ion Chromatography§6.4 Energy Dispersive SpectrometerChapter 7: Other Techniques in Physics and Material Science Analysis§7.1 Micro Fourier Transform Infrared Spectroscopy§7.2 Laser MicroRaman Spectroscopy§7.3 Ellipsometer Technique§7.4 Photon Correlation Spectroscopy