外文题目: Study of effects of Te addition and oxygen contamination on the surface short range order structure of Ge-Bi-Se glass by XPS
作者: Yin, Haiwei; Liu, Yinyao; Li, Lei; Zheng, Jianhua; Zeng, Huidan; Chen, Guorong
刊名: J. Alloy. Compd.
年: 2017 卷: 712 页： 560--566
英文关键词:
Chalcogenide glasses; High-resolution X-ray photoelectron spectroscopy; Structural network
RAY PHOTOELECTRON-SPECTROSCOPY; OPTICAL-PROPERTIES CHANGE; TOPOLOGICAL INSULATOR; THIN-FILMS; CHALCOGENIDE GLASSES; TELLURIDE GLASSES; BI2TE3; SYSTEM; TRANSITION; PHOTONICS
英文摘要:
The short range order structure of Bi13Ge20Se67-xTex glasses (x = 0,5,10,15,20 at.%) is explored by using high-resolution X-ray photoelectron spectroscopy. Results show that the incorporated oxygen from surface containment of specimens and Te substitution for Se exert important impacts on the network structure of glasses. Oxygen breaks the Ge-Ge homopolar bonds in the. Ge-Se-Bi glass, leading to a significant reduction of the over-constrained Ge-Ge (Se)(3) ethane-like units. Te addtion promotes the formation of mixed BiSe(Te)(3/2) nanolayers as crystal precursors, thus initiating crystallinzation in competition to a topological self-organization process. The present work will be helpful to deepen the understanding of ChG glasses for applications in fields of optoelectronics and photonics. (C) 2017 Elsevier B.V. All rights reserved.


文献类型: 期刊论文
正文语种: English
收录类别: SCI
DOI: 10.1016/j.jallcom.2017.04.122


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