外文题目: Dispersion of nonlinear refractive index in layered WS2 and WSe2 semiconductor films induced by two-photon absorption
作者: Dong, Ningning; Li, Yuanxin; Zhang, Saifeng; McEvoy, Niall; Zhang, Xiaoyan; Cui, Yun; Zhang, Long; Duesberg, Georg S.; Wang, Jun
刊名: Opt. Lett.
年: 2016 卷: 41 期: 17 页： 3936--3939
英文关键词:

Z-SCAN MEASUREMENT; THIN-FILMS; PHOTOLUMINESCENCE
英文摘要:
Both the nonlinear absorption and nonlinear refraction properties of WS2 and WSe2 semiconductor films have been characterized by using Z-scan technique with femtosecond pulses at the wavelength of 1040 nm. It is found that these films have two-photon absorption response with the nonlinear absorption coefficient of similar to 103 cmGW-1, and a dispersion of nonlinear refractive index in the WS2 films that translated from positive in the monolayer to negative in bulk materials. (C) 2016 Optical Society of America


文献类型: 期刊论文
正文语种: English
收录类别: SCIEI
DOI: 10.1364/OL.41.003936


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