报告题目：Soft-x-ray spectromicroscopy at the Pohang Light Source II

报 告 人：Hyun-Joon Shin, Pohang Accelerator Laboratory, Pohang, Korea,

报告时间：2017年11月20日上午10：30

报告地点：嘉定学术活动中心307会议室

报告摘要：

After a brief introduction to Pohang Light Sources (PLSs) (3rd generation synchrotron light source and 4th generation x-ray free-electron laser), two kinds of soft x-ray based spectromicroscopy, scanning photoelectron microscopy (SPEM) and scanning transmission x-ray microscopy (STXM), at the PLS will be introduced.

As a very surface sensitive probe for chemical states and electronic structure, SPEM at the PLS has been actively applied for the investigation of 2-D materials with space-resolution of ~0.5 micrometer. SPEM application examples on graphene layers and other kinds of 2-D materials, such as MoS2 and WSe2 materials, will be presented. STXM is a nano x-ray spectroscopy (XAS). STXM at PLS has been operational from 2014 yr., typically with ~30 nm space resolution. Details on STXM performance and application activities will be presented, and then recent attempts to improve functionality, e.g. addition of soft x-ray fluorescence measurement and Ptychography measurement, will be addressed.

Prof. Hyun-Joon Shin
　Education
　1990.3 - 1995.2:　Ph. D. in Experimental Plasma Physics
　Dept. of Physics, Pohang University of Science and Technology
　1986.3 - 1988.2:　M. S. in Optics , Dept. of Physics, Seoul National University
　1982.3 - 1986.3:　B. S. in Physics, Dept. of Physics, Seoul National University.
　Positions held:
　2001.4 - present:　Adjunct Professor, POSTECH
　1996.6 - present:　Principal research scientist (2015 – present)/ Acting principal research scientist (2011-2015)/ Senior research scientist (1999-2011)/ Research Scientist (1996-1999), Pohang Accelerator Laboratory (PAL), POSTECH.
　2016.3 – presents: Head of PLS-II beamline division, PAL, POSTECH
　2006.12 – 2010.:　Leader of ‘Soft x-ray operation team’, Beamline division, PAL, POSTECH.　
　2015.3 – 2016.2:　Visiting Scholar, Elettra-sincrotrone Trieste, Trieste, Italy,
　2005.11-2006.10:　Visiting scholar, Advanced Light Source/Lawrence Berkeley National Laboratory, USA
　1995.3 - 1996.5:　 Postdoctoral fellow, Advanced Light Source/Lawrence Berkeley National Laboratory, USA.
　Membership/Association:
　Korean Physical Society: 1990.12.20 - present
　Korean Vacuum Society: 2000.07.13 - present
　Korean Synchrotron Radiation Users Community: 1997.02.18 - present
　Editorial board of Advertisement Magazine for Korean Physical Society: 2007.05 – 2010.04
　Editorial board of Advertisement Magazine for Korean Synchrotron Radiation Users Community: chairman (2016.1 – present), member (2013.8-2015.12), member (2000.03 – 2004.02)
Program Committee Member: International Conference on X-ray Microscopy: 2004 – 2013 (4 times)
SpectroNanoscopy workshop: organizing chair 2013, 2014, 2015.
　Fields of interest:　
　Submicrometer-scale spectromicroscopy
　Scanning photo-electron microscopy (SPEM)
　Scanning transmission x-ray microscopy (STXM)
　Full field x-ray microscopy (TXM)
　Application of spectroscopy and spectromicroscopy
　　TSO (Transparent semiconducting oxides): Ga-In-Zn-O system
　　PRAM (phase change random access memory): Ge-Sb-Te system
　　OLED (organic light emitting devices): Degradation mechanism
　　Characterization of nano materials and nano devices
　　Molecular nitrogen in solids
　　Effect and use of focused x-rays
　Ultrafast (<1 ps) streak camera development for ultrafast dynamics study
　Plasma spectroscopy (for temperature and density measurement)
　Soft x-ray lasers (generation by capillary discharge)