文献详情
Local electrical characterization of two-dimensional materials with functional atomic force microscopy
文献类型：期刊
通讯作者：Xu, R (reprint author), Natl Ctr Nanosci & Technol, CAS Ctr Excellence Nanosci, CAS Key Lab Standardizat & Measurement Nanotechno, Beijing 100190, Peoples R China.; Xu, R (reprint author), Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China.; Xu, R (reprint author), Renmin Univ China, Beijing Key Lab Optoelect Funct Mat & Micronano D, Beijing 100872, Peoples R China.
期刊名称：FRONTIERS OF PHYSICS影响因子和分区
年：2019
卷：14
期：3
ISSN：2095-0462
关键词：advanced AFM techniques; nanoscale characterization; electrical properties; 2D materials
所属部门：物理学系
摘要：Research about two-dimensional (2D) materials is growing exponentially across various scientific and engineering disciplines due to the wealth of unusual physical phenomena that occur when charge transport is confined to a plane. The applications of 2D materials are highly affected by the electrical properties of these materials, including current distribution, surface potential, dielectric response, conductivity, permittivity, and piezoelectric response. Hence, it is very crucial to characteriz ...More
Research about two-dimensional (2D) materials is growing exponentially across various scientific and engineering disciplines due to the wealth of unusual physical phenomena that occur when charge transport is confined to a plane. The applications of 2D materials are highly affected by the electrical properties of these materials, including current distribution, surface potential, dielectric response, conductivity, permittivity, and piezoelectric response. Hence, it is very crucial to characterize these properties at the nanoscale. The Atomic Force Microscopy (AFM)-based techniques are powerful tools that can simultaneously characterize morphology and electrical properties of 2D materials with high spatial resolution, thus being more and more extensively used in this research field. Here, the principles of these AFM techniques are reviewed in detail. After that, their representative applications are further demonstrated in the local characterization of various 2D materials' electrical properties. ...Hide

DOI：10.1007/s11467-018-0879-7
百度学术：Local electrical characterization of two-dimensional materials with functional atomic force microscopy
语言：外文
被引频次：3
人气指数：3
浏览次数：3
基金：National Natural Science Foundation of China (NSFC)National Natural Science Foundation of China [21622304, 61674045, 11604063]; Ministry of Science and Technology (MOST) of ChinaMinistry of Science and Technology, China [2016YFA0200700]; Strategic Priority Research ProgramChinese Academy of Sciences; Key Research Program of Frontier Sciences and Instrument Developing Project of Chinese Academy of Sciences (CAS) [XDB30000000, QYZDB-SSW-SYS031, YZ201418]; Osaka University's International Joint Research Promotion Program [J171013014, J171013007]; Distinguished Technical Talents Project; Youth Innovation Promotion Association CAS; Fundamental Research Funds for the Central UniversitiesFundamental Research Funds for the Central Universities; Research Funds of Renmin University of China [18XNLG01]
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