陶俊副教授硕士生导师
电话：**
邮箱：taojun@fudan.edu.cn
地址：复旦大学张江校区微电子楼317室
研究所：设计自动化研究所
个人网站：http://homepage.fudan.edu.cn/taojun/
个人简介：
复旦大学微电子学院副教授，IEEE高级会员。主要研究方向为集成电路计算机辅助设计，包括统计数据分析及系统优化等。已在本领域的权威国际期刊和会议IEEE Trans. on CAD、IEEE Trans. on VLSI、DAC、ICCAD等上发表论文40余篇。多次承担/参与国家自然科学基金、国家十一五/十二五科技重大专项等。目前担任IEEE Technical Committee on Very Large Scale Integration (TCVLSI) Newsletter副主编，国际学术会议IEEE ASPDAC 2019, DVCon China 2018-2019、ICCD 2012、TAU 2011等技术委员会成员，以及国际学术期刊IEEE Trans. on CAD、IEEE Trans. on VLSI、ACM Trans. on DAES，国际会议DAC、ICCAD等审稿人。


研究方向：
统计数据分析
混合信号系统优化
集成电路自动化设计
生物芯片设计与测试


教育及学术经历：
2016年-至今复旦大学微电子学院副教授
2012年-2013年美国卡内基梅隆大学电子计算机工程系访问****
2008年-2015年复旦大学微电子学院讲师
2007年复旦大学微电子学系博士


学术任职：
IEEE Senior Member (IEEE高级会员)
IEEE Council on Electronic Design Automation (CEDA) 上海分会主席


代表性论文：
Jun Tao, Yangfeng Su, Dian Zhou, Xuan Zeng and Xin Li, “Graph-Constrained Sparse Performance Modeling for Analog Circuit Optimization via SDP Relaxation,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
Xiaoxue Sun, Chenyang Kong, Yingyu Chen, Jun Tao*, Zhangwen Tang*, “A Synthesizable Constant Tuning Gain Technique for Wideband LC-VCO Design,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
Jun Tao, Zhengqi Gao, Dian Zhou and Xuan Zeng*, “Efficient Statistical Analysis for Correlated Rare Failure Events,” IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2018. (Invited Talk)
Jun Tao, Handi Yu, Yangfeng Su, Dian Zhou*, Xuan Zeng* and Xin Li*, "Correlated Rare Failure Analysis via Asymptotic Probability Evaluation," IEEE Design Automation Conference (DAC), 2017.
Changhai Liao, Jun Tao*, Handi Yu, Zhangwen Tang, Yangfeng Su, Dian Zhou, Xuan Zeng*, Xin Li, “Efficient hybrid performance modeling for analog circuits using hierarchical shrinkage priors,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 35, no. 12, pp. 2148-2152, 2016.
Handi Yu, Jun Tao*, Changhai Liao, Yangfeng Su, Dian Zhou, Xuan Zeng* and Xin Li, “Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation,” IEEE International Conference on Computer Aided Design (ICCAD), 2016.