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Thermal Resistance Testing Technology Research of Integration High Power-LED

本站小编 哈尔滨工业大学/2019-10-24

Thermal Resistance Testing Technology Research of Integration High Power-LED

Ping Xue, Chang-Hong Jia, Xu-Sheng Wang, Hao Sun

(Optic & Electronic Engineering Research Center, Harbin University of Science and Technology, Harbin 150080, China)



Abstract:

In this paper, high-power LED with many integrated chips is used as thermal resistance analysis research object, and we do thermal resistance testing technology research on it. We put forward the thermocouple point contact test method. According to the principle that LED forward voltage changes with temperature, LED heat sink to surface temperature distribution is studied directly in the test, and then we analyze the thermal resistance of high-power LED with many integrated chips when its secondary packaging is introduced. This method makes the measurement of thermal resistance of LED more rapid and convenient. It provides an effective assessment method for the analysis of high power LED device design and engineering application.

Key words:  thermal resistance  junction temperature  integrated high power LED  cooling

DOI:10.11916/j.issn.1005-9113.2013.02.020

Clc Number:TN371

Fund:


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