Analog circuit intelligent fault diagnosis based on GKPCA and multi-class SVM approach

SAN Ye, GUO Ke, ZHU Yi

Control and Simulation Center, Harbin Institute of Technology, Harbin 150001, China



Abstract:

Analog circuits fault diagnosis is essential for guaranteeing the reliability and maintainability of electronic systems. In this paper, a novel analog circuit fault diagnosis approach is proposed based on greedy kernel principal component analysis (KPCA) and one-against-all support vector machine (OAASVM). In order to obtain a successful SVM-based fault classifier, eliminating noise and extracting fault features are very important. Due to the better performance of nonlinear fault features extraction and noise elimination as compared with PCA, KPCA is adopted in the proposed approach. However, when we adopt KPCA to extract fault features of analog circuit, a drawback of KPCA is that the storage required for the kernel matrix grows quadratically, and the computational cost for eigenvector of the kernel matrix grows linearly with the number of training samples. Therefore, GKPCA, which can approximate KPCA with small representation error, is introduced to enhance computational efficiency. Based on the statistical learning theory and the empirical risk minimization principle, SVM has advantages of better classification accuracy and generalization performance. The extracted fault features are then used as the inputs of OAASVM to solve fault diagnosis problem. The effectiveness of the proposed approach is verified by the experimental results.ª¤

Key words:  greedy kernel principal component analysis  one-against-all  support vector machine  fault diagnosis  analog circuitª¤

DOI£º10.11916/j.issn.1005-9113.2012.06.012

Clc Number:TP18

Fund: