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广东工业大学2012年博士学位考试大纲(3038)电子工程

广东工业大学 免费考研网/2012-12-03

广东工业大学

全日制研究生招生考试专业课考试大纲

招生类别:(请选择:√博士生 □学术型硕士生 □专业学位硕士生)

Both PhD and Master students are invited for applications.

考试科目名称: 电子工程

基本内容: (300字以内)

Keyword Syllabus:

Overview of reliability engineering

The needs for reliable products and systems. Failure distributions: Bathtub Failure Curve, and its implications and applications.

Design for Reliability

Reliable design and product quality. Design for reliability process, Failure Modes, Effects and Criticality Analysis (FMECA)

Reliability in product manufacturing

Manufacturing process planning and control, Non-Invasive testing and handling. Reliability acceptance testing, Quality control in electronics production,

Electronic products and systems reliability

Types of failures modes and mechanisms in electronic devices and systems, Reliability of electronic components. Summary of Device Failure Modes. Applications to reliability improvements in electronic product and system design

Reliability Testing

Environmental stress testing in relation to product and system reliability. Planning Reliability Testing, Test Environments, Failure Reporting, Analysis and Corrective Action Systems (FRACAS).

Case Studies

Selected cases are used to illustrate some of the above topics. Laboratory experiments, class discussions and project work will be used to substantiate the relevant cases in question, with a view to integrating the discovery-enriched curriculum (DEC) elements.

题型要求及分数比例:(博士生满分100分,学术型、专业学位硕士生满分均150分)

PhD

Exam: 50% (marks)

Coursework: 50% (marks)

Master

Exam: 75 marks

Coursework: 75 marks

参考书目(包括作者、书目、出版社、出版时间):

Prime Texts

Pascoe, Norman. Reliability Technology: Principles and Practice of Failure Prevention in Electronic Systems. Chichester: Wiley, 2011. Print.

O'Connor, Patrick P., and Andre Kleyner. Practical Reliability Engineering. Oxford: Wiley-Blackwell, 2012. Print.

References

Ireson, William Grant, Clyde F. Coombs, and Richard Y. Moss. Handbook of Reliability Engineering and Management. New York: McGraw Hill, 1996. Print.

Ohring, Milton, Reliability and Failure of Electronic Materials and Devices, 2nd Ed, Academic Press, 2010

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