关键词: 二维原子晶体/
扫描透射电子显微学/
低电压/
缺陷操控
English Abstract
Low voltage scanning transmission electron microscopy for two-dimensional materials
Li Dong-Dong1,2,Zhou Wu1,2
1.School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China;
2.CAS Key Laboratory of Vacuum Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
Fund Project:Project supported by the National Natural Science Foundation of China (Grant No. 51622211) and the CAS Pioneer Hundred Talents Program.Received Date:30 July 2017
Accepted Date:16 September 2017
Published Online:05 November 2017
Abstract:Two-dimensional (2D) materials, such as graphene and transition-metal dichalcogenide monolayers, have unique properties that are distinctly different from those of their bulk counterparts, and hopefully possess a wide range of applications in 2D semiconductor device. Structural defects are known to have profound influences on the properties of crystalline materials; thus, correlating the defect structure with local properties in 2D material is of fundamental importance. However, electron microscopy studies of 2D materials on an atomic scale have become a challenge as most of these materials are susceptible to electron beam irradiation damage under high voltage and high dose experimental conditions. The development of low voltage aberration-corrected scanning transmission electron microscopy (STEM) has made it possible to study 2D materials at a single atom level without damaging their intrinsic structures. In addition, controllable structural modification by using electron beam becomes feasible by controlling the electron beam-sample interaction. New nanostructures can be created and novel 2D materials can be fabricated in-situ by using this approach. In this article, we review some of our recent studies of graphene and transition-metal dichalcogenides to showcase the applications of low voltage aberration corrected STEM in 2D material research.
Keywords: two-dimensional materials/
scanning transmission electron microscopy/
low voltage/
defect engineering
