关键词: 谱线位置定标/
原理修正/
数据处理/
逐行修正
English Abstract
Study on the methods of calibrating spectral line position of interference imaging spectrometer
Wei Yu-Tong1,2,Liu Shang-Kuo3,
Yan Ting-Yu1,2,
Li Qi-Wei1,2
1.School of Science, Xi'an Jiaotong University, Xi'an 710049, China;
2.Institute of Space Optics, Xi'an Jiaotong University, Xi'an 710049, China;
3.Xi'an Institute Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
Fund Project:Project supported by the Key Program of the National Natural Science Foundation of China (Grant No. 41530422), the National Natural Science Foundation of China (Grant Nos. 61540018, 61275184, 61405153), the National Major Project (Grant No. 32-Y30B08-9001-13/15), the National High Technology Research and Development Program of China (Grant No. 2012AA121101), and the Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20130201120047).Received Date:10 November 2015
Accepted Date:12 January 2016
Published Online:05 April 2016
Abstract:The principle of interference imaging spectrometer is presented. According to the drift of recovery spectral line position, two representative methods of calibrating the laboratory spectral line position are proposed, and the calibration results and their comparative analyses are given. One method of calibration is to correct the principle, which embarks from parameter selection of interference imaging spectrometer and the analysis of the reason why the spectral line position is drifted. Aiming at the problem that the position of spectral line changes with row, the correction scheme is given to improve the accuracy of spectral line position. For four given laser wavelengths, which are 543.5 nm, 594.1 nm, 612 nm, and 632.8 nm, the root-mean-square (RMS) error of spectral line position is reduced from 28.3914 to 5.5371 after calibration. For the interferometer system which has no dispersion, the accuracy of calibration is better than the dispersion system, and can be the same at all detected wavelengths. In this article, the calibration accuracy of long wave is better than that of short wave, which is dependent on the selection of the initial correction wavelength. This method achieves a kind of universality for interference imaging spectrometer and its calibration parameters provide a convenient way to analyze the instrument indexes. Another calibration method is data processing. It makes up the deficiencies of the method mentioned above: a large number of data are needed and the effect of calibration at short wave is not good enough. The RMS error of spectral line position is reduced to 0.9178, which proves that the calibration has a really high precision. This method is simple and can correct all the detected wavelengths and spectral lines by using two united formula. Though this method is not applicable for all the interference imaging spectrometers, the idea that makes hard things simple is deserving of our attention. We can use it in many other fields. The essence of the method is to change a variable quantity into a slowly varying quantity by algorithms, and then establish the relationship between the slowly varying quantity and the standard value. This idea can always make a substantial increase in efficiency of calibration and has a satisfied accuracy. Each of the two methods has advantages and disadvantages: which method we choose to use is dependent on the effect we want to achieve, and it is better to make their combination. This study provides a theoretical and practical guidance for study, design, modulation, experiment and engineering of interference imaging spectrometers.
Keywords: spectral line position calibration/
correction of principle/
data processing/
revision by line
