1、招生信息2、教育背景3、工作经历4、教授课程5、合作情况6、指导学生7、发表论文8、学术奖励9、近期科研项目10、专利与奖励11、出版信息12、科研活动
基本信息
李华伟 女 研究员 博导 中国科学院计算技术研究所
电子邮件：lihuawei@ict.ac.cn
通信地址：北京市海淀区科学院南路6号中科院计算所体系结构国家重点实验室
邮政编码：100190

研究领域集成电路设计与测试、近似计算、容错计算

教育背景 1999-07--2001-06 中国科学院计算技术研究所 博士学位
1996-09--1999-06 中国科学院计算技术研究所 硕士学位

工作经历? 2008/10－今，中科院计算所，中科院计算机系统结构重点实验室/计算机体系结构国家重点实验室 研究员
? 2009/08－2010/08，美国UCSB大学，电子与计算机工程系，访问教授
? 2001/10－2008/09，中科院计算所，网络室/中科院计算机系统结构重点实验室，副研究员（2002/03硕士生导师，2006/03博士生导师）
? 2001/07－2001/09，中科院计算所，网络室，助理研究员

教授课程 VLSI测试与可测性设计、 数字系统的故障诊断与可靠设计、 数字系统的故障诊断与容错设计
发表论文Huawei Li, Dawen Xu, Yinhe Han, K.-T. Cheng, Xiaowei Li, “nGFSIM: A GPU-Based 1-to-n-Detection Fault Simulator and its Applications,” Proc. IEEE 41st International Test Conference (ITC’10), Paper 12.1, Austin, USA, Oct. 2010.
Huawei Li, Peifu Shen, and Xiaowei Li, “Robust Test generation for Precise Crosstalk-induced Path Delay Faults,” Proc. IEEE 24th VLSI Test Symposium (VTS’06), Berkeley, CA, USA, May 2006, pp.300-305.
Huawei Li, and Xiaowei Li, “Selection of Crosstalk-induced Faults in Enhanced Delay Test,” Journal of Electronic Testing: Theory and Applications, Vol.21, No.2, 2005, pp.181-195.
Ying Zhang, Huawei Li, Yinghua Min, Xiaowei Li, “Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.19, No.10, 2011, pp.1787-1800.
Minjin Zhang, Huawei Li, Xiaowei Li, “Path Delay Test Generation Toward Activation of Worst Case Coupling Effects,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.19, No.11, 2011, pp.1969-1982.
Xiang Fu, Huawei Li, Xiaowei Li, “Testable path selection and grouping for faster than at-speed testing,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.20, No.2, 2012, pp.236-247.
Songwei Pei, Huawei Li, Xiaowei Li, “A High-Precision On-Chip Path Delay Measurement Architecture,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.20, No.9, 2012, pp.1565-1577.
Songwei Pei, Huawei Li, Xiaowei Li, “Flip-Flop Selection for Partial Enhanced Scan to Reduce Transition Test Data Volume,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.20, No.12, 2012, pp. 2157-2169.
Zijian He, Tao Lv, Huawei Li, Xiaowei Li, “Test Path Selection for Capturing Delay Failures Under Statistical Timing Model,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.21, No.7, July 2013, pp.1210-1219.
Song Jin, Yinhe Han, Huawei Li, Xiaowei Li, “Unified Capture Scheme for Small Delay Defect Detection and Aging Prediction,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.21, No.5, May 2013, pp.821-833.
Ying Zhang, Huawei Li, Xiaowei Li, “Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.21, No.7, July 2013, pp.1220-1233.
Binzhang Fu, Yinhe Han, Huawei Li, Xiaowei Li, “ZoneDefense: A Fault-Tolerant Routing for 2D Meshes Without Virtual Channels,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.22, No.1, pp.113-126, 2014.
Yuntan Fang, Huawei Li, and Xiaowei Li, “Lifetime enhancement techniques for PCM-based image buffer in multimedia applications,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.22, No.6, pp. 1450-1455, June 2014.
Dawen Xu, Huawei Li, Amirali Ghofrani, K.-T. Cheng, Yinhe Han, Xiaowei Li, “Test-Quality Optimization for Variable n-Detections of Transition Faults,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), Vol.22, No.8, pp. 1738-1749, August 2014.
Shuangde Fang, Zidong Du, Yuntan Fang, Yuanjie Huang, Yang Chen, Lieven Eeckhout, Olivier Temam, Huawei Li, Yunji Chen, Chengyong Wu, “Performance Portability Across Heterogeneous SoCs Using a Generalized Library-Based Approach,” ACM Transactions on Architecture and Code Optimization (TACO), Vol. 11, No. 2, Article 21, June 2014.
Ying Wang, Lei Zhang, Yinhe Han, Huawei Li, Xiaowei Li, “Economizing TSV resources in 3D Network-on-Chip design”, IEEE Transactions on Very Large Scaled Integration Systems (TVLSI), Vol. 23, No.3, pp. 493-506, 2015.
Ying Wang, Lei Zhang, Yinhe Han, Huawei Li, Xiaowei Li, “Data Remapping for Static NUCA in Degradable Chip Multiprocessors”, IEEE Transactions on Very Large Scaled Integration Systems (TVLSI), Vol. 23, No.5, pp. 879-892, 2015.
Jian Wang, Huawei Li, Tao Lv, Tiancheng Wang, Xiaowei Li, and Sandip Kundu, “Abstraction-Guided Simulation Using Markov Analysis for Functional Verification,” IEEE Transaction on Computer Aided Design of Integrated Circuits and Systems (TCAD), Vol. 35, No.2, pp.285-297, 2016.
Song Jin, Songwei Pei, Yinhe Han, Huawei Li, “A Cost-Effective Energy Optimization Framework of Multicore SoCs Based on Dynamically Reconfigurable Voltage-Frequency Islands”, ACM Trans. Design Autom. Electr. Syst.(TODAES), Vol.21, No.2, Article 27, 2016.
Guihai Yan, Faqiang Sun, Huawei Li, Xiaowei Li, “CoreRank: Redeeming Imperfect Silicon by Dynamically Quantifying Core-level Healthy Condition of Manycore Processors”, IEEE Transactions on Computers, Vol. 65, No.3, pp.716-729, 2016.
Ying Wang, Yinhe Han, Huawei Li, Xiaowei Li, “VANUCA: Enabling Near-Threshold Voltage Operation in Large-Capacity Cache”, IEEE Transactions on Very Large Scaled Integration Systems (TVLSI), Vol.24, No.3, pp.858-870, 2016.

学术奖励2012年度国家技术发明奖二等奖，获奖项目：“星载微处理器系统验证-测试-恢复技术及应用”

2014年度北京市科学技术奖一等奖，获奖项目：“32位星载容错控制计算机系统关键技术及应用”

2011年度中国质量协会质量技术奖一等奖，获奖项目：“高性能处理芯片的测试和可靠性设计关键技术”

2008年度中国科学院卢嘉锡青年人才奖，2012年入选中国科学院青年创新促进会成员

2008年度中国计算机学会王选奖二等奖，获奖项目：“数字电路测试若干关键技术及其在微处理器测试中的应用”

2008年度北京市科学技术奖（发明类）三等奖，获奖项目：“数字电路实速检测和故障诊断技术及其应用”

2007年度北京市科学技术奖（基础研究类）三等奖，获奖项目：“集成电路逻辑测试与验证基础技术”

2003年度中国科学院杰出科技成就奖，获奖团队：“龙芯CPU”研究集体

2004年度全国优秀博士论文提名：“基于RTL行为模型的测试产生及时延测试方法”

2001年度中国科学院院长奖学金特别奖

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近期科研项目国家自然科学基金重点项目：差错容忍计算器件基础理论和方法，2015/01-2019/12。

国家自然科学基金面上项目：考虑时延变异性的硅后定时验证方法，2012/01-2015/12。

国家973课题：高性能处理芯片的设计验证与测试，2005/12-2010/12。

国家自然科学基金面上项目：避免过度测试的时延测试方法，2008/01-2010/12。

国家自然科学基金面上项目：面向串扰的时延测试，2007/01-2009/12。

国家863项目：可信计算平台软硬件系统安全测试评估模型、测试方法以及测试自动化技术，2007/07-2009/12。

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