guotong@tju.edu.cn
测试计量技术及仪器
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副教授
计量型扫描电镜及双探针扫描探针显微镜标准测量装置的建立

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微结构三维几何参数标准装置

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基于复合式测量方法的超精密元件跨尺度几何量计量与多参数评价

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基于倾斜扫描干涉术的微器件几何量大范围测试方法研究

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微阵列型复杂曲面光学反射镜的复合测量方法与系统

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气体热量计控制系统和数据处理软件

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轮廓处理评价算法研究

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立式干涉仪的技术改造

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基于时间平均显微干涉术的MEMS运动表征技术研究

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基于双频激励动态调制AFM的高分辨亚表面结构表征系统与方法研究

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基于纳米位移平台的白光干涉测量与纳米装配应用开发

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基于超声原子力显微术的表面弹性和亚表面结构的纳米尺度表征

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纳米光栅阵列及白光干涉方法表征
Linnik型干涉光谱测量薄膜的非线性相位补偿方法

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基于新型音叉探针的双频原子力测试系统与方法

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微阵列型复杂曲面光学元件的复合测量系统与方法

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基于纳米测量与倾斜扫描白光干涉微结构测试系统及方法

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基于步进电机的量块自动检定装置

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基于离轴显微干涉术的微结构测试系统及方法
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Accuracy improvement of a white-light spectral interferometer using a line-by-line spectral calibration method

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Analysis of the synchronous phase-shifting method in a white-light spectral interferometer

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Rapid measurement of large step heights using a microscopic white-light spectral interferometer

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Measurement of geometrical parameters of cutting tool based on focus variation technology

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Film thickness measurement based on nonlinear phase analysis using a Linnik microscopic white-light spectral interferometer

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Single point Linnik white-light spectral microscopic interferometer for surface measurement

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Residual vibration control based on a global search method in a high-speed white light scanning interferometer

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Wavelength correction for thin film measurement in a microscopic white light spectral interferometer

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The model analysis of a complex tuning fork probe and its application in bimodal atomic force microscopy

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A nanomeasuring machine based white light tilt scanning interferometer for large scale optical array structure measurement

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MEMS surface characterization based on white light phase shifting interferometry

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Metrological atomic force microscope with self-sensing measuring head

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Micro-motion Analyzer used for Dynamic MEMS Characterization

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A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes

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Multi-wavelength phase-shifting interferometry for micro-structures measurement based on color image processing in white ligh

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Initial estimation of thin film thickness measurement based on white light spectral interferometry

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Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry

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Development of a large-range atomic force microscope measuring system for optical free form surface characterization

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基于白光干涉彩色图像测量微结构的表面形貌