郑长林
研究员
德国柏林洪堡大学博士(2009)
Humboldt University of Berlin, Germany
电话：+86-
E-mail：zcl@fudan.edu.cn
个人网站/Website：链接/Link
主要经历:(Experiences)
1999 南京大学学士
2004 南京大学硕士
2009 德国柏林洪堡大学物理系博士
2010 - 2017 澳大利亚莫纳什大学电子显微中心(MCEM)
Tenured Research Fellow
2017 - 至今复旦大学物理系研究员
教学与研究领域:
研究领域：电子显微学(Electron Microscopy)。
主要研究方向：发展基于像差校正的新型透射电子显微学技术(TEM)并应用于凝聚态物理和材料科学研究。
实验手段包括原子尺度球差校正STEM和TEM, 双球差校正三维共聚焦电子显微镜(SCEM), 相干电子衍射(Coherent CBED), 电子全息及Lorentz显微镜, 电子能量损失谱(EELS)和EDX, Phase Imaging, 微分相衬电子显微镜(DPC), ptychography, 电子束相位及空间调制(Bessel beam, Airy beam等新型电子束)。理论工作集中于研究电子的散射及物理光学过程。

Changlin Zheng

Professor
Ph.D.(2009), Humboldt University of Berlin, Germany.
Research Interests:
Developing and applying advanced electron microscopy techniques to solve problems in condensed matter physics and material science.
TEM techniques: Aberration corrected TEM/STEM, scanning confocal electron microscopy (SCEM), EELS and EDX, DPC, electron holography and Lorentz microscopy, ptychography, coherent CBED, electron phase modulation and beam shaping (Bessel beam, Airy beam…).
Selected Publications:
1）C. L. Zheng, T. Petersen, H. Kirmse, W. Neumann, M. Morgan, J Etheridge, Axicon lens for electrons using a magnetic vortex: The efficient generation of a Bessel beam, Phys. Rev. Lett. 119 (17), 174801 (2017). (Editors’ suggestion)
2) C.L. Zheng, H. Kirmse, J. Long, D. Laughlin, M. McHenry, W. Neumann, Investigation of (Fe, Co) NbB-Based nanocrystalline soft magnetic alloys by Lorentz microscopy and off-axis electron holography, Microscopy and Microanalysis 21 (02), 498-509 (2015). (Cover image)
3) C.L. Zheng, Y. Zhu, S. Lazar, J. Etheridge, Fast imaging with Inelastically scattered electrons by off-axis chromatic confocal electron microscopy, Phys. Rev. Lett. 112 (16), 166101 (2014). (Editors’ suggestion and featured in Physics Today).
4) C.L. Zheng, J. Wong-Leung, Q. Gao, H.H Tan, C. Jagadish, J. Etheridge, Polarity-driven 3-fold symmetry of GaAs/AlGaAs core multishell nanowires, Nano Lett. 13 (8), 3742-3748 (2013).
5) C.L. Zheng, J. Etheridge, Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction, Ultramicroscopy 125, 49-58 (2013).
6) CL Zheng, K. Scheerschmidt, H. Kirmse, I. H?usler, W. Neumann, Imaging of three-dimensional (Si, Ge) nanostructures by off-axis electron holography, Ultramicroscopy 124, 108-116 (2013).