Jun FENG professor
email: fengj@sustech.edu.cn
Office：
Research Field：advanced electron materials、novel energy materials, liquid materials、 brightness electron source、quantum electron microscopy、ultrafast phenomena and detectors、synchrotron radiation、 free electron laser.



Scientistsand students, who are interested in doing research in advanced materials andcharacterization using different methods, brightness electron source, quantumelectron microscopy, ultrafast dynamics, synchrotron radiation, free electron laser,are encouraged to get in touch with me at fengj@sustech.edu.cn. Wehave several positions such as Ph.D., Post-doc, research assistant professor inthe group.


JunFeng is a full professor at the department of materials science and engineeringand institute for quantum science and engineering, SUSTECH. His currentresearch fields are: 1) advanced electron materials, 2) novel energy materials,liquid materials, 3) brightness electron source, 4) quantum electronmicroscopy, 3) ultrafast phenomena and detectors, 4) synchrotron radiation, 5)free electron laser.

Selectedpublications

1:Gregory M. Su, Isvar A. Cordova, MichaelA. Yandrasits, Matthew Lindell, Jun Feng,Cheng Wang, and Ahmet Kusoglu, Chemical and Morphological Origins of ImprovedIon Conductivity in Per?uoroIonene Chain Extended Ionomers, Journalof the American Chemical society, 141, 13547(2019)

2:Yan Xu, Yifan Ye,Shuyang Zhao, Jun Feng,Jia Li, Hao Chen, Ankun Yang, Feifei Shi,Lujie Jia, Yang Wu, Xiaoyun Yu,Per-Anders Glans-Suzuki, Yi Cui, Jinghua Guo, and Yuegang Zhang, In Situ X?ray Absorption SpectroscopicInvestigation of the Capacity Degradation Mechanism in Mg/S Batteries, Nano Lett, 19, 2928(2019)

3:A. Scholl , M.A. Marcus , A. Doran , J.R.Nasiatka , A.T. Young , A .A .MacDowell , R. Streubel , N. Kent , JunFeng , W.Wan , H.A. Padmore, Hartmann characterization of the PEEM-3aberration-corrected X-ray photoemission electron microscope, Ultramicroscpy, 188, 77(2018)

4:L Zhang, M Ling, Jun Feng, L Mai, GLiu, J Guo, The synergetic interaction between LiNO3 and lithium polysulfidesfor suppressing shuttle effect of lithium-sulfur batteries,
, Energy Storage Materials 11, (2018)24-29

5:Rita Wang, Deep B.Shah, J Maslyn, W Loo, K Wujcik, E. Nelson, M. Latimer, Jun Feng, DPrendergast, T. Pascal and NitashBalsara, Rate Constants of Electrochemical Reactions in a Lithium-Sulfur Celldetermined by Operando X-ray Absorption Spectroscopy, Journalof The Electrochemical Society ,165 , A3487(2018)

6:S.Karkare, J.Feng, X.Chen, W.Wan,J.Palomares, T.C.Chiag, H.PAdmore, Reduction of intrinsic photocathodes usingordered crystalline surfaces, Phys.Rev.Lett.,118,164802(2017)

7: Jun Feng, S.Karkare, J.Nasiatka,S.Schubert, J.Smedley, H.PAdmore Near Atomically smooth alkali antimonidephotocathode thin files, J.of App.Phys. 121,044904(2017)

8:Y Opachich, J Koch, P Bell, D Bradley, N Chen, Jun Feng, A Gopal, A Semiconductor-Based High-Yield X-RayPhotocathode, LO-007-17, Nevada NationalSecurity Site/Mission Support and Test Services LLC, 2016, DOE/NV/03624-0261

9:S.Gupta, Jun Feng, L.Chan,C.Petzold, C.Ralston, Synchrotron X-ray footprinting as a method to visualizewater in proteins, J.Synchrotron Rad.,23,1056(2016)

10:L.Poyneer, N.F.Brejnholt, R.Hill, J.Jackson, L.Hagler,R.Celestre, Jun Feng, X-ray metrology andperformance of a 45-cm long x-ray deformable mirror, Rev. Sci. Instru., 87, 052003(2016)

11: Jun Feng, J.Nasiatka, Weishi, Wan,S.Karkare, J.Smedley, H.Padmore, Thermal Limit to the intrinsic from metalphotocathodes, Applied Physics Letters,107,
134101(2015)

12: J. Feng, J. Nasiatka, W. Wan, T.Vecchione, and H. A. Padmore, A novel system for measurement of the transverse electronmomentum distribution from photocathodes, Rev.Sci. Instrum, 86, 015103 (2015)

13:A. Polyakov,C. Senft, K. F. Thompson, J.Feng, S.Cabrini, P. J. Schuck, and H. A. Padmore Plasmon-EnhancedPhotocathode for High Brightness and High Repetition Rate X-Ray Sources , Phy. Rev.Lett., 110, 076802 (2013)

14:, R.K.Li, , H.To, G. Andonian, J. Feng,A. Polyakov, C. M. Scoby, K. Thompson,W. Wan, H.A. Padmore, and P. Musumeci, Surface-Plasmon Resonance-Enhanced Multiphoton Emission of High-Brightness ElectronBeams from a Nanostructured Copper cathode, Phy. Rev.Lett., 110, 074801 (2013)

15:F. Sannibale, D. Filippetto, C. F. Papadopoulos, J. Staples, R. Wells, B.Bailey, K.
Baptiste,J. Corlett, C. Cork,S. De Santis, S. Dimaggio, L. Doolittle, J. Doyle, Jun Feng, D. Garcia Quintas, G. Huang,H. Huang, T. Kramasz,S. Kwiatkowski, R. Lellinger, V. Moroz, W. E. Norum, H.Padmore, C. Pappas, G. Portmann, T.Vecchione,M. Vinco, M. Zolotorev, and F.Zucca,Advanced photoinjector experiment photogun commissioning results, Phys. Rev. ST Accel. Beams, 15,(2012)103501

16:T.Vecchione, I.Ben-Zvi, D.H.Dowell, J.Feng,T.Rao, J.Smedley, W.Wan, H.A.PAdmore A low emittance and high efficiencyvisible light photocathode for high
brightnessaccelerator based x-ray light source, AplliedPhysics Letters, 99, 034103(2011)

17:B. I. Cho,K. Engelhorn,A. A. Correa,T. Ogitsu,C. P.Weber,H. J. Lee, J. Feng, P. A. Ni,Y. Ping,A. J.Nelson,D. Prendergast, R.W.Lee, R.W. Falcone,and P. A. Heimann, Electronic Structureof Warm Dense Copper Studied by Ultrafast X-Ray
AbsorptionSpectroscopy, PHYSICAL REVIEW LETTERS,106,167601 (2011)

18: J.Feng, K.Engelhorn, B.I.Cho,H.J.Lee, M.Greaves, C.P.Weber, R.W.Falcone, H.A.Padmore, P.A.Heimann A grazingincidence x-ray streak camera for ultra-fast, single shot measurement , Applied Physics Letters, 96, 134102(2010)

19: J. Feng, H. J. Shin, J. R. Nasiatka,W. Wan, A. T. Young, G. Huang, A. Comin,
J.Byrd, and H. A. Padmore, An x-ray streak camera with high spatio-temporalresolution, Appl. Phys. Lett. 91, 134102 (2007)

20: J Feng, E Forest, A AMacDowell, MMarcus, H Padmore, S Raoux, D Robin, A Scholl, R Schlueter, P Schmid, J St?hr,W Wan, D H Wei and Y Wu An x-ray photoemission electron microscope using an electronmirror aberrationcorrector for the study of complex materials, J. Phys.: Condens. Matter 17, S1339 (2005)

Books:
1) Book chapter: Photoemission ElectronMicroscopy (PEEM), Jun Feng andAndreas Scholl, Book Title: Science ofMicroscopy, Edited by Dr.Peter Hawkes and John Spence, page 657-696,published by Klumer/Springer Academic publishers in
2007,2019 2nd edition.