Author(s): Liu, XQ (Liu, Xiangquan); Zheng, J (Zheng, Jun); Li, XL (Li, Xiuli); Niu, CQ (Niu, Chaoqun); Peng, LH (Peng, Linzhi); Wan, FS (Wan, Fengshuo); Liu, Z (Liu, Zhi); Zuo, YH (Zuo, Yuhua); Xue, CL (Xue, Chunlai); Cheng, BW (Cheng, Buwen)
Source: JOURNAL OF MATERIALS SCIENCE Volume: 55 Issue: 11 Pages: 4762-4768 DOI: 10.1007/s10853-019-04334-6 Published: APR 2020
Abstract: Crystalline germanium-lead (GePb) alloys were deposited on Ge(100) substrates via magnetron sputtering epitaxy. Strip-shaped Pb segregation along the direction was observed on the Ge0.976Pb0.024 film surface, as revealed by scanning electron microscopy. The chemical compositions and structural properties of the strip-shaped segregation were investigated by energy-dispersive X-ray spectroscopy, cross-sectional transmission electron microscopy and micro-Raman scattering spectra. The Ge0.976Pb0.024 film remained high crystal quality even after Pb segregation. The strip-shaped segregation was mainly composed of polycrystalline Pb, and its surface was covered with a GePb nanocrystalline layer.
Accession Number: WOS:000511972700017
ISSN: 0022-2461
eISSN: 1573-4803
Full Test: https://link.springer.com/article/10.1007%2Fs10853-019-04334-6