文献详情
Thickness-Dependent In-Plane Polarization and Structural Phase Transition in van der Waals Ferroelectric CuInP2S6
文献类型：期刊
通讯作者：Wang, XY; Hong, JW (reprint author), Beijing Inst Technol, Sch Aerosp Engn, Beijing 100081, Peoples R China.; Gao, P (reprint author), Peking Univ, Sch Phys, Electron Microscopy Lab, Beijing 100871, Peoples R China.; Gao, P (reprint author), Peking Univ, Sch Phys, Int Ctr Quantum Mat, Beijing 100871, Peoples R China.; Gao, P (reprint author), Collaborat Innovat Ctr Quantum Matter, Beijing 100871, Peoples R China.
期刊名称：SMALL影响因子和分区
年：2020
卷：16
期：1
ISSN：1613-6810
关键词：ferroelectric domains; in-plane ferroelectricity; structural phase transition; van der Waals ferroelectrics
所属部门：物理学系
摘要：van der Waals (vdW) layered materials have rather weaker interlayer bonding than the intralayer bonding, therefore the exfoliation along the stacking direction enables the achievement of monolayer or few layers vdW materials with emerging novel physical properties and functionalities. The ferroelectricity in vdW materials recently attracts renewed interest for the potential use in high-density storage devices. With the thickness becoming thinner, the competition between the surface energy, depol ...More
van der Waals (vdW) layered materials have rather weaker interlayer bonding than the intralayer bonding, therefore the exfoliation along the stacking direction enables the achievement of monolayer or few layers vdW materials with emerging novel physical properties and functionalities. The ferroelectricity in vdW materials recently attracts renewed interest for the potential use in high-density storage devices. With the thickness becoming thinner, the competition between the surface energy, depolarization field, and interfacial chemical bonds may give rise to the modification of ferroelectricity and crystalline structure, which has limited investigations. In this work, combining the piezoresponse force microscope scanning, contact resonance imaging, the existence of the intrinsic in-plane polarization in vdW ferroelectrics CuInP2S6 single crystals is reported, whereas below a critical thickness between 90 and 100 nm, the in-plane polarization disappears. The Young's modulus also shows an abrupt stiffness at the critical thickness. Based on the density functional theory calculations, these behaviors are ascribed to a structural phase transition from monoclinic to trigonal structure, which is further verified by transmission electron microscope technique. These findings demonstrate the foundational importance of structural phase transition for enhancing the rich functionality and broad utility of vdW ferroelectrics. ...Hide

DOI：10.1002/smll.201904529
百度学术：Thickness-Dependent In-Plane Polarization and Structural Phase Transition in van der Waals Ferroelectric CuInP2S6
语言：外文
人气指数：2
浏览次数：2
基金：National Natural Science Foundation of ChinaNational Natural Science Foundation of China [11572040, 11604011, 11804023, 51672007, 11974023, 11874422, 11574391]; China Postdoctoral Science FoundationChina Postdoctoral Science Foundation [2018M641205]; Beijing Natural Science FoundationBeijing Natural Science Foundation [Z190011]; The Key R&D Program of Guangdong Province [2018B030327001, 2018B010109009]; Fundamental Research Funds for the Central UniversitiesFundamental Research Funds for the Central Universities; Renmin University of China [18XNLG14, 19XNLG18]; Special Program for Applied Research on Super Computation of the NSFC-Guangdong Joint Fund (the second phase) [U1501501]
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