科研人员
姓名胡瑜
性别女
职称研究员
个人主页
个人介绍
简历:
博士，现为中国科学院计算技术研究所研究员、博士生导师、中国计算机学会容错计算专业委员会委员、IEEE会员、ACM会员、IEICE会员。分别于1993年、1999年和2003年在电子科技大学（UESTC）获得工学学士、硕士和博士学位。2003年8月进入中国科学院计算技术研究所博士后流动站，2005年8月留所工作至今。2006年获日本学术振兴会CenterofExcellence基金资助和香港中文大学SinoBritishFellowshipTrust资助，先后短期访问日本奈良先端科学技术大学院大学和香港中文大学。曾获得2009年度中国科学院卢嘉锡青年人才奖和2007年度北京市科技新星等多项奖励。
个人主页：http://test.ict.ac.cn/site/YuHu/Index.html.

研究方向:

数字集成电路的可靠性设计

社会任职:


获奖及荣誉:

代表论著:
国际刊物论文
[1]SongjunPan,YuHu,XiaoweiLi,“X-FillingforSimultaneousShift-andCapture-PowerReductioninAt-SpeedScan-BasedTesting”,toappearinIEEETransactionsonVLSISystems.
[2]JiaLI,YuHU,XiaoweiLI,“ScanChainDesignforShiftPowerReductioninScan-basedTesting”,ScienceinChina(InformationSciences),Vol.54,No.4,2011,pp.767-777.
[3]JiaLi,QiangXu,YuHu,XiaoweiLi,“X-FillingforSimultaneousShift-andCapture-PowerReductioninAt-SpeedScan-BasedTesting”,IEEETransactionsonVLSISystems,Vol.18,No.7,2010,pp.1081-1092.
[4]DaWang,YuHu,HuaweiLi,XiaoweiLi,“TheDesign-for-TestabilityFeaturesandTestImplementationofaGigaHertzGeneralPurposeMicroprocessor”,JournalofComputerScienceandTechnology(JCST),Vol.23,No.6,2008,pp.1037-1046.
[5]YinheHan,YuHu,XiaoweiLi,AnshumanChandra,andHuaweiLi,“EmbeddedTestDecompressortoReducetheRequiredChannelsandVectorMemoryofTesterforSystem-on-a-Chip”,IEEETransactionsonVLSISystems(TVLSI),Vol.15,No.5,2007,pp.531-540.
[6]WeiWang,YuHu,YinheHan,XiaoweiLi,YoushengZhang,“LeakageCurrentOptimizationTechniquesduringTestbasedonDon’tCareBitsAssignment”,JournalofComputerScienceandTechnology(JCST),Vol.22,No.5,2007,pp.673-680.
[7]YuHu,YinheHan,XiaoweiLi,HuaweiLi,XiaoqingWen,“Compression/ScanCo-DesignforReducingTestDataVolume,Scan-inPowerDissipation,andTestApplicationTime”,IEICETransactionsonInformationandSystems,Vol.E89-D,No.10,2006,pp.2616-2625.
[8]YinheHan,YuHu,XiaoweiLi,HuaweiLi,AnshumanChandra,andXiaoqingWen,“WrapperScanChainsDesignforRapidandLowPowerTestingofEmbeddedCores”,IEICETransactionsonInformationandSystems,Vol.E88-D,No.10,2005,pp.2126-2134.
国际会议论文
[1]ShuchangShan,YuHu,XiaoweiLi,TransparentDynamicBindingwithFault-TolerantCacheCoherenceProtocolforChipMultiprocessors,intheProceedingsofIEEE/IFIPInternationalConferenceonDependableSystemsandNetworks(DSN),Hongkong,China,27-31June,2011,pp.291-302.
[2]SongjunPan,YuHu,XingHu,andXiaoweiLi,ACost-effectiveSubstantial-impact-filterBasedMethodtoTolerateVoltageEmergencies,intheProceedingsofIEEE/ACMConferenceonDesign,AutomationandTestinEurope(DATE),Grenoble,France,14-18March,2011,pp.311-316.
[3]KehengHuang,YuHu,andXiaoweiLi,Cross-layerOptimizedPlacementandRoutingforFPGASoftErrorMitigation,intheProceedingsofIEEE/ACMConferenceonDesign,AutomationandTestinEurope(DATE),Grenoble,France,14-18March,2011,pp.58-63.
[4]JingYe,YuHu,andXiaoweiLi,OnDiagnosisofMultipleFaultsUsingCompactedResponses,intheProceedingsofIEEE/ACMConferenceonDesign,AutomationandTestinEurope(DATE),Grenoble,France,14-18March,2011,pp.679-684.
[5]SongjunPan,YuHu,andXiaoweiLi,“IVF:CharacterizingtheVulnerabilityofMicroprocessorStructurestoIntermittentFaults”,intheProceedingsofIEEE/ACMConferenceonDesign,AutomationandTestinEurope(DATE),Dresden,Germany,2010,238-243.(BestPaperAwardNomination)
[6]JingYe,YuHu,andXiaoweiLi,“DiagnosisofMultipleArbitraryFaultswithMaskandReinforcementEffect”,intheProceedingsofIEEE/ACMConferenceonDesign,AutomationandTestinEurope(DATE),Dresden,Germany,2010,pp.885-890.
[7]FeiWang,YuHu,YuHuang,HuaweiLi,XiaoweiLi,JingYe,“DeterministicDiagnosticPatternGeneration(DDPG)forCompoundDefects”,intheProceedingsofIEEEInternationalTestConference(ITC),SantaClara,USA,2008,paper14.1.
[8]JiaLi,XiaoLiu,YubinChen,YuHu,XiaoweiLi,QiangXu,“OnCapturePower-AwareTestDataCompressionforScan-BasedTesting”,intheProceedingsofIEEE/ACMInternationalConferenceonComputer-AidedDesign(ICCAD),SanJose,USA,2008,paper1C.3.
[9]YuHu,XiangFu,XiaoxinFan,andHideoFujiwara,“LocalizedRandomAccessScan:TowardsLowAreaandRoutingOverhead”,intheProceedingsofIEEE/ACMAsiaandSouthPacificDesignAutomationConference(ASP-DAC),Seoul,Korea,2008,pp.565-570.
[10]DaWang,XiaoxinFan,XiangFu,HuiLiu,KeWen,HuaweiLi,YuHu,XiaoweiLi,RuiLi,“TheDesign-for-TestabilityFeaturesofAGeneral-PurposeMicroprocessor,”intheProceedingsofIEEEInternationalTestConference(ITC),SantaClara,USA,2007,paper9.2.
[11]YuHu,ChengLi,JiaLi,Yin-HeHan,Xiao-WeiLi,WeiWang,Hua-WeiLi,Laung-Terng(L.-T.)Wang,andXiao-QingWen,“TestDataCompressionBasedonClusteredRandomAccessScan”,intheProceedingsofIEEEAsianTestSymposium(ATS),Fukuoka,Japan,2006,pp.231-236.
[12]YuHu,YinheHan,XiaoweiLi,“Compression/ScanCo-DesigntoReduceTestDataVolume,Scan-inPowerDissipationandTestApplicationTime”,intheProceedingsofIEEEPacific-RimDependableComputing(PRDC),Changsha,China,December12-14,2005,pp.175-182.
[13]YuHu,YinheHan,HuaweiLi,TaoLv,XiaoweiLi,“PairBalance-BasedTestSchedulingforSOCs”,intheProceedingsofIEEEAsianTestSymposium(ATS),Kenting,Taiwan,2004,pp.236-241.



承担科研项目情况:
在研项目
1.国家自然科学基金青年科学基金课题，大规模多核系统芯片测试压缩方法研究
2.国家自然科学基金面上课题，面向多个物理缺陷的纳米尺度极大规模数字电路故障诊断
3.横向课题，SRAM型FPGA容错设计
4.横向课题，基于失效机理的SRAM型FPGA可靠性设计研究
5.横向课题，数字集成电路故障诊断已结题项目
1.国家自然科学基金SOC重大研究计划面上课题，嵌入式存储器内建自修复方法研究
2.国家973计划课题：高性能处理芯片的可靠性设计
3.国家自然科学基金SOC重大研究计划重点项目滚动课题，微处理器自修复设计基础技术研究
4.国家863计划探索导向类课题，动态可重构高可靠计算机体系结构及关键实现技术
5.国家863计划探索导向类课题，大规模高可靠片上多处理器的系统结构及实现方法
6.国家863计划子课题，龙芯2号增强型处理器芯片的可测试性设计及样片测试
7.北京市科技新星计划A类课题，嵌入式存储器内建自修复方法研究

学科类别:


所属部门:
系统结构重点实验室
专家类别:
正高

杰青入选时间:

百人入选时间:



其他备注:
博导计算机系统结构
其他备注2:

其他备注3: