中文关键词:XPS测试数据预处理技巧 英文关键词:XPSData acquisitionData preprocessingMethods and Techniques 基金项目:国家自然科学基金项目(U1609219)资助

作者	单位	E-mail
范 燕	华南理工大学	1315107565@qq.com
徐昕荣	华南理工大学	1315107565@qq.com

摘要点击次数:160 全文下载次数:0 中文摘要: X射线光电子能谱(XPS)广泛应用于材料表面分析表征,因XPS分析方法的主观性相对较强,谱图测试及分析水平会对数据分析质量产生很大影响。为获得更好的数据质量,文章根据国际标准和实际测试经验总结出一种通用于不同类型材料表面分析表征的XPS数据采集和预处理分析思路,以方便测试人员能够更加系统的进行数据采集和分析,为材料研发人员提供更加全面的元素组成信息和谱图解析注意事项,从而更有效地助力材料表面分析研究,该方法对科研工作者分析准确度的提高具有重要的理论意义和实际应用价值。 英文摘要: X-ray photoelectron spectroscopy (XPS) is widely used in the characterization of material surface. Due to the relatively strong subjectivity of XPS analysis method, the level of testing technology and analysis will have a great impact on the quality of final result. According to the international standard and practical testing experience, this paper summarizes an idea of XPS data acquisition and preprocessing analysis, so as to facilitate testers to collect and analyze data more systematically. This method provides researchers with more comprehensive information on the composition of elements and considerations for spectrom analysis, thus facilitating the surface analysis of materials more effectively. It has important theoretical significance and practical application value for improving the analysis accuracy of researchers. introduced. 查看全文查看/发表评论下载PDF阅读器 相关附件：版权转让声明书附件1 -->