姓名：闫爱斌
性别：男
出生年月：1983年3月


导师类别：博导、硕导
专业技术职称：副教授

招生专业代码及名称：0812计算机、0854电子信息（学术型、专业型）

联系方式：abyan@mail.ustc.edu.cn QQ: **

研究方向： 宇航芯片冗余容错
(1) 评估数字系统软错误率的软件开发（C++编程）
(2) 可信微型存储部件的仿真与设计（EDA编程）
(3) 高鲁棒性航天嵌入式微系统设计（Verilog编程）

个
人
简
介
闫爱斌，男，山东德州人。08年先后赴日本神奈川、東京六本木实习，09年获得中国科学技术大学工程硕士学位。09年至12年，先后在上海思华科技、科大国创软件公司担任软件研发工程师、项目组长等职务，软件开发与项目管理经验丰富。15年获得合肥工业大学工学博士学位。16年加入安徽大学。18年至19年国家公派（留学）访问日本。曾担任国际学术会议ATS18宣传主席和程序委员会委员。现担任国家自然科学基金项目函评专家、中国计算机学会容错计算专业委员会委员、以及国际权威期刊如IEEE Trans. on Industrial Electronics，IEEE Trans. on Emerging Topics in Computing，IEEE Trans. on VLSI Systems，IEEE Trans. on Nanotechnology，IEEE Trans. on Device and Materials Reliability的审稿专家。先后与日本法国等建立长期深入而稳定的合作关系，可与国外教授（IEEE Fellow）联合培养博士生。
详情见网页：http://ca.hfut.edu.cn/xyz/

科研成果
（一）近年来发表的期刊与会议论文列表（节选20篇、一作）
Aibin Yan, Yuanjie Hu, et al, "Information Assurance through Redundant Design: A Novel TNU Error-Resilient Latch…,"
IEEE Transactions on Computers, 2020. 中科院分区（下同）大类二区. CCF A类. 计科领域国际顶级期刊.
Aibin Yan, Xiangfeng Feng, et al, "Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications…,"
IEEE Transactions on Aerospace and Electronic Systems, 2020. 小类一区. 宇航电子领域国际顶级期刊.
Aibin Yan, Yan Chen, et al, "Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches…,"
IEEE Transactions on Aerospace and Electronic Systems, pp. 1-12, 2020. 同上.
Aibin Yan, Zhelong Xu, et al, "A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design…,"
IEEE Transactions on Aerospace and Electronic Systems, pp. 1-10, 2019. 同上.
Aibin Yan, Yafei Ling, et al, Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells based Multiple-Node-Upset-Tolerant Latch
IEEE Transactions on Circuits and Systems I: Regular Papers, 2020. 大类一区. 电路系统领域国际顶级期刊.
Aibin Yan, Yan Chen, et al, "Novel Speed-and-Power-Optimized SRAM Cell Designs with Enhanced Self-Recoverability from …,"
IEEE Transactions on Circuits and Systems I: Regular Papers, 2020. 同上.
Aibin Yan, Zhen Wu, et al, "Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design…,"
IEEE Transactions on Reliability, vol. 68, no. 1, pp. 354-363, 2019. 大类二区. 可靠性领域国际顶级期刊.
Aibin Yan, Zhelong Xu, et al, "Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead in Harsh Radiation…,"
IEEE Transactions on Emerging Topics in Computing, 2020. 18/19大类二区. 前沿计算领域国际著名期刊. Minor Revision.
Aibin Yan, Kang Yang, et al, "A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power…,"
IEEE Transactions on Circuits and Systems II: Express Briefs, 2019. 大类二区. 电路系统领域国际著名期刊.
Aibin Yan, Chaoping Lai, et al, "Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS,"
IEEE Transactions on Emerging Topics in Computing, pp. 1-14, 2018. 18/19大类二区. 前沿计算领域国际著名期刊.
Aibin Yan, Zhengfeng Huang, et al, "Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology,"
IEEE Transactions on Very Large Scale Integration Systems, 2017. 大类二区. CCF B类. VLSI设计领域国际著名期刊.
Aibin Yan, Xiangfeng Feng, et al, "HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filtering Latch…,"
IEEE Design Automation Conference,Oral, 2020/7/19-23, 美国旧金山. CCF A类. 体系结构领域国际顶级会议.
Aibin Yan, Yan Chen, et al, "N-1 Errors Interceptive Multiple-Modular-Redundancy Voter Designs for Safety-Critical Applications,"
IEEE Design Automation Conference, Poster, pp. 1-6, 2020/7/19-23. CCF A类. 同上.
Aibin Yan, Yuanjie Hu, et al, "Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch…,"
IEEE Design, Automation and Test in EuropeConference, Oral, pp. 1-6, 2019/3/25-29, 意大利佛罗轮萨. CCF B类.
Aibin Yan, Yan Chen, et al, "TNUINC: Triple-Node-Upset-Immune Nano-scale CMOS Latch Design for Aerospace Applications,"
IEEE International Conference on Computer Design, Poster, pp. 1-6, 2019/11/17-20, 阿拉伯阿布扎比. CCF B类.
Aibin Yan, Xuejun Li, et al. "High performance, low cost, and double node upset tolerant latch design,"
IEEE International Conference on Dependable Systems and Networks, Fast Abstract, 2016/6/28-2016/7/1, 法国图卢兹. CCF B类.
Aibin Yan, Zhelong Xu, et al, "Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design…,"
IEEE International Symposium on Circuits and Systems, 2020/5/17-20, 西班牙塞维利亚. 电路系统领域国际顶级会议.
Aibin Yan, Zhengfeng Huang, et al, "HLDTL: High-performance, low-cost, and double node upset tolerant latch design,"
IEEE VLSI Test Symposium, pp. 1-6, 2017/4/9-12. 美国拉斯维加斯.
Aibin Yan, Zhengfeng Huang, et al, "Novel low cost and double node upset tolerant latch design for nanoscale CMOS technology,"
IEEE Asian Test Symposium,pp. 1-6, 2016/11/21-24. 日本广岛.
Aibin Yan, Huaguo Liang, et al, "An SEU resilient, SET filterable and cost effective latch in presence of PVT variations,"
Microelectronics Reliability, vol. 63,no. 1,pp. 239-250, 2016.
（二）近年来申请/授权的国家发明专利列表（节选10件）
1．闫爱斌, 唐锡铭, 等, "一种容忍任意三节点翻转并过滤瞬态脉冲的锁存器", 申请号: 20**
2．闫爱斌, 冯祥凤, 等, "一种N-1级故障过滤表决器", 申请号: 1.6
3．闫爱斌, 胡元节, 等, "一种任意三节点翻转完全自恢复的锁存器", 申请号: 7.6
4．闫爱斌, 吴珍, 等, "一种三个内部节点翻转完全免疫的锁存器," 申请号: 6.X
5．闫爱斌, 崔杰, 易茂祥, 黄正峰, "高性能低开销的双节点翻转在线自恢复锁存器," 申请号: 8.2
6．闫爱斌, 王华彬, 黄正峰, 易茂祥, "高性能低开销的单粒子翻转在线自恢复锁存器," 申请号: 5.0
7．梁华国, 闫爱斌, 等, "一种延缓老化并容忍软错误的集成电路选择性加固方法," 申请号: 7.6
8．黄正峰, …, 闫爱斌, 等, "一种基于延时单元的自恢复抗单粒子锁存器结构," 申请号: 7.2
9．黄正峰, …, 闫爱斌, 等, "一种基于双模冗余的抗单粒子多节点翻转加固锁存器," 申请号: 1.0
10．欧阳一鸣, …, 闫爱斌, "片上网络中新颖的故障与拥塞模型下的容错方法," 已授权, ZL4.9

在研项目
国家自然科学基金面上项目, “抗单粒子多节点翻转与多瞬态的加固单元设计研究,” 编号**, 2020.1-2023.12, 项目负责人/主持人.
国家自然科学基金青年项目, “纳米集成电路软错误率评估关键技术研究”, 编号**, 2017.1-2019.12, 项目负责人/主持人.
国家自然科学基金青年项目, “无防篡改设备的高效车载自组网隐私保护关键技术研究”, 编号**, 2018.1-2020.12, 项目参与人.
国家自然科学基金面上项目, “星载系统芯片(SoC)的抗辐射加固设计研究”, 编号**, 2016.1-2019.12, 项目参与人.

获奖情况
CTC2018学术会议最佳论文奖
安徽省“挑战杯”大学生课外学术科技作品竞赛特等奖（指导教师）
全国“挑战杯”大学生课外学术科技作品竞赛三等奖（指导教师）